Characterisation of organic thin films by friction force and transverse shear microscopy

Quan Shen, Thomas Potocar, Adolf Winkler, Christian Teichert

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearch

Original languageEnglish
Title of host publicationSelf assembly and hybride devices
Publisher.
Pages48-48
Publication statusPublished - 2012

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Shen, Q., Potocar, T., Winkler, A., & Teichert, C. (2012). Characterisation of organic thin films by friction force and transverse shear microscopy. In Self assembly and hybride devices (pp. 48-48). ..