Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques

Mario Schmied, Stefan Mitsche

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication13th European Microscopy Congress
Publisher.
Pages159-160
Publication statusPublished - 2004

Cite this

Schmied, M., & Mitsche, S. (2004). Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. In 13th European Microscopy Congress (pp. 159-160). ..

Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. / Schmied, Mario; Mitsche, Stefan.

13th European Microscopy Congress. ., 2004. p. 159-160.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Schmied, M & Mitsche, S 2004, Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. in 13th European Microscopy Congress. ., pp. 159-160.
Schmied M, Mitsche S. Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. In 13th European Microscopy Congress. . 2004. p. 159-160
Schmied, Mario ; Mitsche, Stefan. / Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. 13th European Microscopy Congress. ., 2004. pp. 159-160
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