Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques

Mario Schmied, Stefan Mitsche

Research output: Contribution to conference › Poster

Original languageEnglish
Publication statusPublished - 2004
Event13th European Microscopy Congress - Antwerpen / Belgien
Duration: 22 Aug 2004 → 27 Aug 2004

Conference

Conference13th European Microscopy Congress
CityAntwerpen / Belgien
Period22/08/04 → 27/08/04

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