Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques

Mario Schmied, Stefan Mitsche

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2004
Event13th European Microscopy Congress - Antwerpen / Belgien
Duration: 22 Aug 200427 Aug 2004

Conference

Conference13th European Microscopy Congress
CityAntwerpen / Belgien
Period22/08/0427/08/04

Cite this

Schmied, M., & Mitsche, S. (2004). Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .

Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. / Schmied, Mario; Mitsche, Stefan.

2004. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .

Research output: Contribution to conferencePosterResearch

Schmied, M & Mitsche, S 2004, 'Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques' 13th European Microscopy Congress, Antwerpen / Belgien, 22/08/04 - 27/08/04, .
Schmied M, Mitsche S. Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. 2004. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .
Schmied, Mario ; Mitsche, Stefan. / Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques. Poster session presented at 13th European Microscopy Congress, Antwerpen / Belgien, .
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title = "Channeling contrast by Focused Ion Beam and EBSD - two complementary techniques",
author = "Mario Schmied and Stefan Mitsche",
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note = "13th European Microscopy Congress ; Conference date: 22-08-2004 Through 27-08-2004",

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AU - Schmied, Mario

AU - Mitsche, Stefan

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