Channel length variation in self-aligned, nanoimprint lithography structured OTFTs

T. Rothländer, A. Fian, Johanna Kraxner, Werner Grogger, Herbert Gold, Anja Haase, B. Stadlober

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)3274-3281
JournalOrganic electronics
Volume15
DOIs
Publication statusPublished - 2014

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Channel length variation in self-aligned, nanoimprint lithography structured OTFTs. / Rothländer, T.; Fian, A.; Kraxner, Johanna; Grogger, Werner; Gold, Herbert; Haase, Anja; Stadlober, B.

In: Organic electronics, Vol. 15, 2014, p. 3274-3281.

Research output: Contribution to journalArticleResearchpeer-review

Rothländer, T, Fian, A, Kraxner, J, Grogger, W, Gold, H, Haase, A & Stadlober, B 2014, 'Channel length variation in self-aligned, nanoimprint lithography structured OTFTs' Organic electronics, vol. 15, pp. 3274-3281. https://doi.org/10.1016/j.orgel.2014.08.055
Rothländer, T. ; Fian, A. ; Kraxner, Johanna ; Grogger, Werner ; Gold, Herbert ; Haase, Anja ; Stadlober, B. / Channel length variation in self-aligned, nanoimprint lithography structured OTFTs. In: Organic electronics. 2014 ; Vol. 15. pp. 3274-3281.
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AU - Rothländer, T.

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AU - Gold, Herbert

AU - Haase, Anja

AU - Stadlober, B.

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