Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests

Research output: Contribution to conferencePaperResearchpeer-review

Original languageEnglish
Publication statusPublished - 21 May 2018
Event12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018 - Xi'an, China
Duration: 20 May 201824 May 2018
http://www.icpadm2018.org/

Conference

Conference12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018
Abbreviated titleICPADM 2018
CountryChina
CityXi'an
Period20/05/1824/05/18
Internet address

Cite this

Pischler, O., & Schichler, U. (2018). Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. Paper presented at 12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018, Xi'an, China.

Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. / Pischler, Oliver; Schichler, Uwe.

2018. Paper presented at 12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018, Xi'an, China.

Research output: Contribution to conferencePaperResearchpeer-review

Pischler, O & Schichler, U 2018, 'Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests' Paper presented at 12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018, Xi'an, China, 20/05/18 - 24/05/18, .
Pischler O, Schichler U. Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. 2018. Paper presented at 12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018, Xi'an, China.
Pischler, Oliver ; Schichler, Uwe. / Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. Paper presented at 12th International Conference on the Properties and Applications of Dielectric Materials, ICPADM 2018, Xi'an, China.
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