Capacitance to Digital Converter Based Parallelized Multi-Channel Measurement System

Matthias Flatscher, Gerald Schwarz, Markus Neumayer, Thomas Bretterklieber

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Off-the-shelf capacitance to digital converter (CDC) are widely available application specific integrated circuits (ASIC) to build capacitive sensors. For capacitive measurement systems with an increased number of channels, the application of these CDCs is often limited due to their measurement rate. In this paper we propose a parallelized multi-channel measurement system based on off-the-shelf capacitance to digital converters. We identify possible CDCs for the use in a parallel measurement system and demonstrate the usability of the approach by means of measurement results determined on a realized prototype.
Original languageEnglish
Title of host publicationI2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
PublisherInstitute of Electrical and Electronics Engineers
Pages1191-1195
Number of pages5
ISBN (Electronic)978-150903596-0
DOIs
Publication statusPublished - 2017
Event2017 IEEE International Instrumentation and Measurement Technology Conference: I2MTC 2017 - Turin, Italy
Duration: 22 May 201725 May 2017
http://2017.imtc.ieee-ims.org/

Conference

Conference2017 IEEE International Instrumentation and Measurement Technology Conference
Abbreviated titleI2MTC
Country/TerritoryItaly
CityTurin
Period22/05/1725/05/17
Internet address

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