Calibration Method for an RF I-V Based HF RFID Impedance Measurement System

Benjamin J.B. Deutschmann*, Michael Gadringer, Richard Fischbacher, Lukas Görtschacher, Franz Amtmann, Erich Merlin, Ulrich Muehlmann, Jasmin Grosinger

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

This paper presents a novel measurement system based on the radio frequency (RF) current-voltage (I-V) method of impedance measurements, capable of providing high sensitivity over a wide range of impedance. We use this system to characterize high frequency (HF) radio frequency identification (RFID) chips. A newly developed calibration method enables us to calibrate the system using three well-known calibration standards. Besides, we estimated the accuracy of our measurement system using another set of well-known reference standards. We achieved a high accuracy (1.5%) compared with related measurement systems, which are, in general, based on vector network analyzer (VNA) measurements (3.2%). In comparison with VNA-based systems, our proposed measurement system provides a low-cost, yet accurate method of measuring HF RFID chip impedances.

Original languageEnglish
Title of host publication97th ARFTG Microwave Measurement Conference
Subtitle of host publicationConducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021
PublisherInstitute of Electrical and Electronics Engineers
Pages1-4
Number of pages4
ISBN (Electronic)9780738112480
ISBN (Print)978-1-6654-4794-2
DOIs
Publication statusPublished - 2021
Event97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity: ARFTG 2021 - Virtual, Atlanta, United States
Duration: 25 Jun 202125 Jun 2021

Conference

Conference97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity
Abbreviated titleARFTG 2021
Country/TerritoryUnited States
CityVirtual, Atlanta
Period25/06/2125/06/21

Keywords

  • Calibration
  • Chip
  • HF
  • Impedance
  • Measurement
  • Nonlinear
  • RF I-V
  • RFID

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering
  • Computer Networks and Communications

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

Fingerprint

Dive into the research topics of 'Calibration Method for an RF I-V Based HF RFID Impedance Measurement System'. Together they form a unique fingerprint.

Cite this