Broadband phase resolving spectrum analyzer measurement for EMI scanning applications

Zongyi Chen, Shubhankar Marathe, Hamed Kajbaf, Stephan Frei, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review


EMI scanning application requires phase and magnitude information for the creation of equivalent radiation models and for far-field prediction. Magnitude information can be obtained using rather an inexpensive spectrum analyzer (SA). Phase-resolving instruments such as vector network analyzers (VNA) or oscilloscopes are very expensive for frequencies above 5 GHz. For this reason, this paper proposes a method that utilizes a SA for phase-resolved magnitude measurements. The basic principle is to measure the sum or difference of two signals for different phase shifts and deduct the phase from the combined output of those measurements. The phase is retrieved using an optimization procedure. It is shown that the proposed approach can recover phase deviation within 20° when using six steps of variable attenuator control voltage for the test cases between 5 and 12 GHz.

Original languageEnglish
Title of host publication2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
PublisherInstitute of Electrical and Electronics Engineers
Number of pages6
ISBN (Electronic)9781479966158
Publication statusPublished - 10 Sep 2015
Externally publishedYes
EventIEEE International Symposium on Electromagnetic Compatibility: EMC 2015 - Dresden, Germany
Duration: 16 Aug 201522 Aug 2015

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118


ConferenceIEEE International Symposium on Electromagnetic Compatibility


  • EMI scanning
  • phase-resolved measurements
  • spectrum analyzer (SA)

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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