Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy

Robert Winkler, M.J. Cordill, J. Kreith, T. Strunz, G.E. Fantner, E.J. Fantner, Harald Plank

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 7 May 2015
Event5th ASEM Workshop - Graz, Austria
Duration: 7 Jun 20158 Jun 2015

Conference

Conference5th ASEM Workshop
CountryAustria
CityGraz
Period7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • My Favorites

Cite this

Winkler, R., Cordill, M. J., Kreith, J., Strunz, T., Fantner, G. E., Fantner, E. J., & Plank, H. (2015). Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy. 5th ASEM Workshop, Graz, Austria.

Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy. / Winkler, Robert; Cordill, M.J.; Kreith, J.; Strunz, T.; Fantner, G.E.; Fantner, E.J.; Plank, Harald.

2015. 5th ASEM Workshop, Graz, Austria.

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Winkler, R, Cordill, MJ, Kreith, J, Strunz, T, Fantner, GE, Fantner, EJ & Plank, H 2015, 'Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy' 5th ASEM Workshop, Graz, Austria, 7/06/15 - 8/06/15, .
Winkler R, Cordill MJ, Kreith J, Strunz T, Fantner GE, Fantner EJ et al. Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy. 2015. 5th ASEM Workshop, Graz, Austria.
Winkler, Robert ; Cordill, M.J. ; Kreith, J. ; Strunz, T. ; Fantner, G.E. ; Fantner, E.J. ; Plank, Harald. / Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy. 5th ASEM Workshop, Graz, Austria.
@conference{56265afb57b14279ae682b7f32ec5951,
title = "Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy",
author = "Robert Winkler and M.J. Cordill and J. Kreith and T. Strunz and G.E. Fantner and E.J. Fantner and Harald Plank",
year = "2015",
month = "5",
day = "7",
language = "English",
note = "5th ASEM Workshop ; Conference date: 07-06-2015 Through 08-06-2015",

}

TY - CONF

T1 - Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy

AU - Winkler, Robert

AU - Cordill, M.J.

AU - Kreith, J.

AU - Strunz, T.

AU - Fantner, G.E.

AU - Fantner, E.J.

AU - Plank, Harald

PY - 2015/5/7

Y1 - 2015/5/7

M3 - (Old data) Lecture or Presentation

ER -