Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy

Robert Winkler, M.J. Cordill, J. Kreith, T. Strunz, G.E. Fantner, E.J. Fantner, Harald Plank

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 7 May 2015
Event5th ASEM Workshop - Graz, Austria
Duration: 7 Jun 20158 Jun 2015

Conference

Conference5th ASEM Workshop
CountryAustria
CityGraz
Period7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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Cite this

Winkler, R., Cordill, M. J., Kreith, J., Strunz, T., Fantner, G. E., Fantner, E. J., & Plank, H. (2015). Beyond Current SEM – AFM Solutions: A Highly Flexible in-situ AFM for Correlated Microscopy. 5th ASEM Workshop, Graz, Austria.