Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM

G. Danilatos, Johannes Rattenberger, V. Dracopoulos

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	online-online
Journal	Journal of microscopy
DOIs	https://doi.org/10.111/j.1365-2818.2010.03455.x
Publication status	Published - 2010

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

Danilatos, G., Rattenberger, J., & Dracopoulos, V. (2010). Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM. Journal of microscopy, online-online. https://doi.org/10.111/j.1365-2818.2010.03455.x

@article{9f21ed8157e64cf8b9a02338c78459c1,

title = "Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM",

author = "G. Danilatos and Johannes Rattenberger and V. Dracopoulos",

year = "2010",

doi = "10.111/j.1365-2818.2010.03455.x",

language = "English",

pages = "online--online",

journal = "Journal of microscopy",

issn = "0022-2720",

publisher = "Wiley-Blackwell",

}

Access to Document

10.111/j.1365-2818.2010.03455.x

Related content

Projects

Imaging Processes in Scanning Electron Microscopy

Project: Research project