Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM

G. Danilatos, Johannes Rattenberger, V. Dracopoulos

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)online-online
JournalJournal of microscopy
DOIs
Publication statusPublished - 2010

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM. / Danilatos, G.; Rattenberger, Johannes; Dracopoulos, V.

In: Journal of microscopy, 2010, p. online-online.

Research output: Contribution to journalArticleResearchpeer-review

@article{9f21ed8157e64cf8b9a02338c78459c1,
title = "Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM",
author = "G. Danilatos and Johannes Rattenberger and V. Dracopoulos",
year = "2010",
doi = "10.111/j.1365-2818.2010.03455.x",
language = "English",
pages = "online--online",
journal = "Journal of microscopy",
issn = "0022-2720",
publisher = "Wiley-Blackwell",

}

TY - JOUR

T1 - Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM

AU - Danilatos, G.

AU - Rattenberger, Johannes

AU - Dracopoulos, V.

PY - 2010

Y1 - 2010

U2 - 10.111/j.1365-2818.2010.03455.x

DO - 10.111/j.1365-2818.2010.03455.x

M3 - Article

SP - online-online

JO - Journal of microscopy

JF - Journal of microscopy

SN - 0022-2720

ER -