| Original language | English |
|---|---|
| Pages (from-to) | online-online |
| Journal | Journal of microscopy |
| DOIs | |
| Publication status | Published - 2010 |
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)
Cite this
Danilatos, G., Rattenberger, J., & Dracopoulos, V. (2010). Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM. Journal of microscopy, online-online. https://doi.org/10.111/j.1365-2818.2010.03455.x
Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM. / Danilatos, G.; Rattenberger, Johannes; Dracopoulos, V.
In: Journal of microscopy, 2010, p. online-online.Research output: Contribution to journal › Article › Research › peer-review
Danilatos, G, Rattenberger, J & Dracopoulos, V 2010, 'Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM' Journal of microscopy, pp. online-online. https://doi.org/10.111/j.1365-2818.2010.03455.x
Danilatos G, Rattenberger J, Dracopoulos V. Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM. Journal of microscopy. 2010;online-online. https://doi.org/10.111/j.1365-2818.2010.03455.x
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title = "Beam transfer characteristics of a commercial environmental SEM and a low vacuum SEM",
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AU - Danilatos, G.
AU - Rattenberger, Johannes
AU - Dracopoulos, V.
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DO - 10.111/j.1365-2818.2010.03455.x
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JO - Journal of microscopy
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