Soft X-ray tomography has become a standard diagnostic equipment to investigate plasma profiles. Due to limitations in viewing-access and detector numbers the reconstruction of the two-dimensional emissivity profile constitutes a highly underdetermined inversion problem. We discuss the principle features of the tomography problem from the Bayesian point of view in various stages of sophistication. The approach is applied to real-world data obtained from the Wendelstein 7AS stellerator.
|Title of host publication||Maximum Entropy and Bayesian Methods|
|Editors||John Skilling, Sibusiso Sibisi|
|Number of pages||9|
|ISBN (Print)||978-94-010-6534-4 978-94-009-0107-0|
|Publication status||Published - 1996|
|Name||Fundamental Theories of Physics|
- Analytical Chemistry, Probability Theory and Stochastic Processes, Statistical Physics, Dynamical Systems and Complexity, Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences