Autumated Analysis of Submicron Particles in SEM

Peter Pölt, Mario Schmied, Thomas Brunner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInstrumentation and Methodology
PublisherCzechoslovak Society for Electron Microscopy
Pages283-284
ISBN (Print)80-2385503-4
Publication statusPublished - 2000
EventEuropean Congress on Electron Microscopy - Brno, Czech Republic
Duration: 9 Jul 200014 Jul 2000

Conference

ConferenceEuropean Congress on Electron Microscopy
CountryCzech Republic
CityBrno
Period9/07/0014/07/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Pölt, P., Schmied, M., & Brunner, T. (2000). Autumated Analysis of Submicron Particles in SEM. In Instrumentation and Methodology (pp. 283-284). Czechoslovak Society for Electron Microscopy.