Automatic surface reconstruction using sem images based on a new computer vision approach

Stefan Scherer; Peter Werth; Axel Pinz; Andrea Tatschl; Otmar Kolednik

Automatic surface reconstruction using sem images based on a new computer vision approach

Stefan Scherer, Peter Werth, Axel Pinz, Andrea Tatschl, Otmar Kolednik

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Electron microscopy and analysis 1999
Editors	C. J. Kiely
Place of Publication	Bristol
Publisher	Institute of Physics Publ.
Pages	107-110
Volume	161
ISBN (Print)	0-7503-0577-0
Publication status	Published - 1999
Event	Institute of Physics Electron Microscopy and Analysis Group Conference - Sheffield, United Kingdom Duration: 24 Aug 1999 → 27 Aug 1999

Publication series

Name	Institute of Physics conference series
Publisher	Inst. of Physics Publ.

Conference

Conference	Institute of Physics Electron Microscopy and Analysis Group Conference
Country/Territory	United Kingdom
City	Sheffield
Period	24/08/99 → 27/08/99

Cite this

Automatic surface reconstruction using sem images based on a new computer vision approach. / Scherer, Stefan; Werth, Peter; Pinz, Axel et al.
Electron microscopy and analysis 1999. ed. / C. J. Kiely. Vol. 161 Bristol: Institute of Physics Publ., 1999. p. 107-110 (Institute of Physics conference series).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Scherer, S, Werth, P, Pinz, A, Tatschl, A & Kolednik, O 1999, Automatic surface reconstruction using sem images based on a new computer vision approach. in CJ Kiely (ed.), Electron microscopy and analysis 1999. vol. 161, Institute of Physics conference series, Institute of Physics Publ., Bristol, pp. 107-110, Institute of Physics Electron Microscopy and Analysis Group Conference, Sheffield, United Kingdom, 24/08/99.

@inproceedings{51c4b91783fc4730857e6b4c3e13b631,

title = "Automatic surface reconstruction using sem images based on a new computer vision approach",

author = "Stefan Scherer and Peter Werth and Axel Pinz and Andrea Tatschl and Otmar Kolednik",

year = "1999",

language = "English",

isbn = "0-7503-0577-0",

volume = "161",

series = "Institute of Physics conference series",

publisher = "Institute of Physics Publ.",

pages = "107--110",

editor = "Kiely, {C. J.}",

booktitle = "Electron microscopy and analysis 1999",

note = "Institute of Physics Electron Microscopy and Analysis Group Conference ; Conference date: 24-08-1999 Through 27-08-1999",

}

TY - GEN

T1 - Automatic surface reconstruction using sem images based on a new computer vision approach

AU - Scherer, Stefan

AU - Werth, Peter

AU - Pinz, Axel

AU - Tatschl, Andrea

AU - Kolednik, Otmar

PY - 1999

Y1 - 1999

M3 - Conference paper

SN - 0-7503-0577-0

VL - 161

T3 - Institute of Physics conference series

SP - 107

EP - 110

BT - Electron microscopy and analysis 1999

A2 - Kiely, C. J.

PB - Institute of Physics Publ.

CY - Bristol

T2 - Institute of Physics Electron Microscopy and Analysis Group Conference

Y2 - 24 August 1999 through 27 August 1999

ER -