Automatic surface reconstruction using sem images based on a new computer vision approach

Stefan Scherer, Peter Werth, Axel Pinz, Andrea Tatschl, Otmar Kolednik

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationElectron microscopy and analysis 1999
    EditorsC. J. Kiely
    Place of PublicationBristol
    PublisherInstitute of Physics Publ.
    Pages107-110
    Volume161
    ISBN (Print)0-7503-0577-0
    Publication statusPublished - 1999
    EventInstitute of Physics Electron Microscopy and Analysis Group Conference - Sheffield, United Kingdom
    Duration: 24 Aug 199927 Aug 1999

    Publication series

    NameInstitute of Physics conference series
    PublisherInst. of Physics Publ.

    Conference

    ConferenceInstitute of Physics Electron Microscopy and Analysis Group Conference
    CountryUnited Kingdom
    CitySheffield
    Period24/08/9927/08/99

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