Automatic surface reconstruction using sem images based on a new computer vision approach

Stefan Scherer, Peter Werth, Axel Pinz, Andrea Tatschl, Otmar Kolednik

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationElectron microscopy and analysis 1999
EditorsC. J. Kiely
Place of PublicationBristol
PublisherInstitute of Physics Publ.
Pages107-110
Volume161
ISBN (Print)0-7503-0577-0
Publication statusPublished - 1999
EventInstitute of Physics Electron Microscopy and Analysis Group Conference - Sheffield, United Kingdom
Duration: 24 Aug 199927 Aug 1999

Publication series

NameInstitute of Physics conference series
PublisherInst. of Physics Publ.

Conference

ConferenceInstitute of Physics Electron Microscopy and Analysis Group Conference
CountryUnited Kingdom
CitySheffield
Period24/08/9927/08/99

Cite this

Scherer, S., Werth, P., Pinz, A., Tatschl, A., & Kolednik, O. (1999). Automatic surface reconstruction using sem images based on a new computer vision approach. In C. J. Kiely (Ed.), Electron microscopy and analysis 1999 (Vol. 161, pp. 107-110). (Institute of Physics conference series). Bristol: Institute of Physics Publ..

Automatic surface reconstruction using sem images based on a new computer vision approach. / Scherer, Stefan; Werth, Peter; Pinz, Axel; Tatschl, Andrea; Kolednik, Otmar.

Electron microscopy and analysis 1999. ed. / C. J. Kiely. Vol. 161 Bristol : Institute of Physics Publ., 1999. p. 107-110 (Institute of Physics conference series).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Scherer, S, Werth, P, Pinz, A, Tatschl, A & Kolednik, O 1999, Automatic surface reconstruction using sem images based on a new computer vision approach. in CJ Kiely (ed.), Electron microscopy and analysis 1999. vol. 161, Institute of Physics conference series, Institute of Physics Publ., Bristol, pp. 107-110, Institute of Physics Electron Microscopy and Analysis Group Conference, Sheffield, United Kingdom, 24/08/99.
Scherer S, Werth P, Pinz A, Tatschl A, Kolednik O. Automatic surface reconstruction using sem images based on a new computer vision approach. In Kiely CJ, editor, Electron microscopy and analysis 1999. Vol. 161. Bristol: Institute of Physics Publ. 1999. p. 107-110. (Institute of Physics conference series).
Scherer, Stefan ; Werth, Peter ; Pinz, Axel ; Tatschl, Andrea ; Kolednik, Otmar. / Automatic surface reconstruction using sem images based on a new computer vision approach. Electron microscopy and analysis 1999. editor / C. J. Kiely. Vol. 161 Bristol : Institute of Physics Publ., 1999. pp. 107-110 (Institute of Physics conference series).
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