Automatic Fault Diagnosis of Infrared Insulator Images Based on Image Instance Segmentation and Temperature Analysis

Bin Wang, Ming Dong, Ming Ren*, Zhanyu Wu, Chenxi Guo, Tianxin Zhuang, Oliver Pischler, Jiacheng Xie

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Chemical Engineering

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Engineering