Automatic dead time optimization in a high frequency DC-DC buck converter in 65 nm CMOS

Gerhard Maderbacher, Thomas Jackum, Michael Wassermann, Andreas Petschar, Christoph Sandner, Wolfgang Pribyl

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageEnglish
Title of host publicationProceedings of IEEE ESSCIRC 2011
Publisher.
Pages487-490
StatusPublished - 2011
Event37th European Solid-State Circuits Conference - Helsinki, Finland
Duration: 12 Sep 201116 Sep 2011

Conference

Conference37th European Solid-State Circuits Conference
CountryFinland
CityHelsinki
Period12/09/1116/09/11

Fields of Expertise

  • Sonstiges

Cite this

Maderbacher, G., Jackum, T., Wassermann, M., Petschar, A., Sandner, C., & Pribyl, W. (2011). Automatic dead time optimization in a high frequency DC-DC buck converter in 65 nm CMOS. In Proceedings of IEEE ESSCIRC 2011 (pp. 487-490). ..

Automatic dead time optimization in a high frequency DC-DC buck converter in 65 nm CMOS. / Maderbacher, Gerhard; Jackum, Thomas; Wassermann, Michael; Petschar, Andreas; Sandner, Christoph; Pribyl, Wolfgang.

Proceedings of IEEE ESSCIRC 2011. ., 2011. p. 487-490.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Maderbacher, G, Jackum, T, Wassermann, M, Petschar, A, Sandner, C & Pribyl, W 2011, Automatic dead time optimization in a high frequency DC-DC buck converter in 65 nm CMOS. in Proceedings of IEEE ESSCIRC 2011. ., pp. 487-490, 37th European Solid-State Circuits Conference, Helsinki, Finland, 12/09/11.
Maderbacher G, Jackum T, Wassermann M, Petschar A, Sandner C, Pribyl W. Automatic dead time optimization in a high frequency DC-DC buck converter in 65 nm CMOS. In Proceedings of IEEE ESSCIRC 2011. .2011. p. 487-490.
Maderbacher, Gerhard ; Jackum, Thomas ; Wassermann, Michael ; Petschar, Andreas ; Sandner, Christoph ; Pribyl, Wolfgang. / Automatic dead time optimization in a high frequency DC-DC buck converter in 65 nm CMOS. Proceedings of IEEE ESSCIRC 2011. ., 2011. pp. 487-490
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