Automated X-Ray Elemental Analysis in Three Dimensions Using a Dual Beam-Focused Ion Beam system

Miroslava Schaffer, Julian Wagner, Hartmuth Schröttner, Mario Schmied

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)248-250
JournalPractical metallography = Praktische Metallographie
Volume44
Issue number5
Publication statusPublished - 2007

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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