| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010 |
| Publisher | . |
| Pages | 587-594 |
| Publication status | Published - 2010 |
Fields of Expertise
- Information, Communication & Computing
Cite this
Bachmann, C., Genser, A., Steger, C., Weiß, R., & Haid, J. (2010). Automated Power Characterization for Run-Time Power Emulation of SoC Designs. In Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010 (pp. 587-594). ..
Automated Power Characterization for Run-Time Power Emulation of SoC Designs. / Bachmann, Christian; Genser, Andreas; Steger, Christian; Weiß, Reinhold; Haid, Josef.
Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. ., 2010. p. 587-594.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Bachmann, C, Genser, A, Steger, C, Weiß, R & Haid, J 2010, Automated Power Characterization for Run-Time Power Emulation of SoC Designs. in Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. ., pp. 587-594.
Bachmann C, Genser A, Steger C, Weiß R, Haid J. Automated Power Characterization for Run-Time Power Emulation of SoC Designs. In Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. . 2010. p. 587-594
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title = "Automated Power Characterization for Run-Time Power Emulation of SoC Designs",
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AU - Bachmann, Christian
AU - Genser, Andreas
AU - Steger, Christian
AU - Weiß, Reinhold
AU - Haid, Josef
PY - 2010
Y1 - 2010
M3 - Conference contribution
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BT - Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010
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