Automated Power Characterization for Run-Time Power Emulation of SoC Designs

Christian Bachmann, Andreas Genser, Christian Steger, Reinhold Weiß, Josef Haid

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageEnglish
Title of host publicationProceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010
Publisher.
Pages587-594
StatusPublished - 2010

Fields of Expertise

  • Information, Communication & Computing

Cite this

Bachmann, C., Genser, A., Steger, C., Weiß, R., & Haid, J. (2010). Automated Power Characterization for Run-Time Power Emulation of SoC Designs. In Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010 (pp. 587-594). ..

Automated Power Characterization for Run-Time Power Emulation of SoC Designs. / Bachmann, Christian; Genser, Andreas; Steger, Christian; Weiß, Reinhold; Haid, Josef.

Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. ., 2010. p. 587-594.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bachmann, C, Genser, A, Steger, C, Weiß, R & Haid, J 2010, Automated Power Characterization for Run-Time Power Emulation of SoC Designs. in Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. ., pp. 587-594.
Bachmann C, Genser A, Steger C, Weiß R, Haid J. Automated Power Characterization for Run-Time Power Emulation of SoC Designs. In Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. .2010. p. 587-594.
Bachmann, Christian ; Genser, Andreas ; Steger, Christian ; Weiß, Reinhold ; Haid, Josef. / Automated Power Characterization for Run-Time Power Emulation of SoC Designs. Proceedings of the 13th Euromicro Conference on Digital System Design (DSD) 2010. ., 2010. pp. 587-594
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