Automated particle size measurement of submicron particles in scanning electron microscopy

Stefan Mitsche, Peter Pölt, Mario Schmied

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationScanning 2003, San Diego; Scanning 25,
Publisher.
Pages62-62
Publication statusPublished - 2003

Cite this

Mitsche, S., Pölt, P., & Schmied, M. (2003). Automated particle size measurement of submicron particles in scanning electron microscopy. In Scanning 2003, San Diego; Scanning 25, (pp. 62-62). ..

Automated particle size measurement of submicron particles in scanning electron microscopy. / Mitsche, Stefan; Pölt, Peter; Schmied, Mario.

Scanning 2003, San Diego; Scanning 25,. ., 2003. p. 62-62.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Mitsche, S, Pölt, P & Schmied, M 2003, Automated particle size measurement of submicron particles in scanning electron microscopy. in Scanning 2003, San Diego; Scanning 25,. ., pp. 62-62.
Mitsche S, Pölt P, Schmied M. Automated particle size measurement of submicron particles in scanning electron microscopy. In Scanning 2003, San Diego; Scanning 25,. . 2003. p. 62-62
Mitsche, Stefan ; Pölt, Peter ; Schmied, Mario. / Automated particle size measurement of submicron particles in scanning electron microscopy. Scanning 2003, San Diego; Scanning 25,. ., 2003. pp. 62-62
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