| Original language | English |
|---|---|
| Title of host publication | Scanning 2003, San Diego; Scanning 25, |
| Publisher | . |
| Pages | 62-62 |
| Publication status | Published - 2003 |
Automated particle size measurement of submicron particles in scanning electron microscopy
Stefan Mitsche, Peter Pölt, Mario Schmied
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review