Automated near-field scanning to identify resonances

Muchaidze Giorgi*, Huang Wei, Jin Min, Shao Peng, Jim Drewniak, David Pommerenke

*Corresponding author for this work

Research output: Contribution to journalConference article

Abstract

Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

Original languageEnglish
Article number4786897
JournalIEEE International Symposium on Electromagnetic Compatibility
DOIs
Publication statusPublished - 1 Jan 2008
Externally publishedYes
Event2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, United States
Duration: 18 Aug 200822 Aug 2008

Keywords

  • EMI
  • ESD
  • Near field scanning
  • Resonance

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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