Automated Analysis of Submicron Particles in SEM?

Peter Pölt, Mario Schmied

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2000
EventEuropean Congress on Electron Microscopy - Brno, Czech Republic
Duration: 9 Jul 200014 Jul 2000

Conference

ConferenceEuropean Congress on Electron Microscopy
CountryCzech Republic
CityBrno
Period9/07/0014/07/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Pölt, P., & Schmied, M. (2000). Automated Analysis of Submicron Particles in SEM?. Poster session presented at European Congress on Electron Microscopy, Brno, Czech Republic.

Automated Analysis of Submicron Particles in SEM? / Pölt, Peter; Schmied, Mario.

2000. Poster session presented at European Congress on Electron Microscopy, Brno, Czech Republic.

Research output: Contribution to conferencePosterResearch

Pölt, P & Schmied, M 2000, 'Automated Analysis of Submicron Particles in SEM?' European Congress on Electron Microscopy, Brno, Czech Republic, 9/07/00 - 14/07/00, .
Pölt P, Schmied M. Automated Analysis of Submicron Particles in SEM?. 2000. Poster session presented at European Congress on Electron Microscopy, Brno, Czech Republic.
Pölt, Peter ; Schmied, Mario. / Automated Analysis of Submicron Particles in SEM?. Poster session presented at European Congress on Electron Microscopy, Brno, Czech Republic.
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title = "Automated Analysis of Submicron Particles in SEM?",
author = "Peter P{\"o}lt and Mario Schmied",
year = "2000",
language = "English",
note = "European Congress on Electron Microscopy ; Conference date: 09-07-2000 Through 14-07-2000",

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TY - CONF

T1 - Automated Analysis of Submicron Particles in SEM?

AU - Pölt, Peter

AU - Schmied, Mario

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M3 - Poster

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