Automated Analysis of Submicron Particles by Computer-Controlled Scanning Electron Microscopy

Peter Poelt, M. Schmied, Ingwald Obernberger, Thomas Brunner, Jonas Dahl

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)92-100
JournalScanning
Issue number24
Publication statusPublished - 2002

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