Original language | English |
---|---|
Pages (from-to) | 92-100 |
Journal | Scanning |
Issue number | 24 |
Publication status | Published - 2002 |
Automated Analysis of Submicron Particles by Computer-Controlled Scanning Electron Microscopy
Peter Poelt, M. Schmied, Ingwald Obernberger, Thomas Brunner, Jonas Dahl
Research output: Contribution to journal › Article › peer-review