Atomic resolution scanning transmission electron microscopy analysis of Sr and Yb addition in Al-Si alloys

Mihaela Albu, J. Li, P. Schumacher, Gerald Kothleitner, Ferdinand Hofer

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 3 Sept 2013
Event	International Congress on Light Materials - Bremen, Germany Duration: 3 Sept 2013 → 5 Sept 2013

Conference	International Congress on Light Materials
Country/Territory	Germany
City	Bremen
Period	3/09/13 → 5/09/13

Fields of Expertise

@conference{c29b701086e842cdb65b084bfedbaef9,

title = "Atomic resolution scanning transmission electron microscopy analysis of Sr and Yb addition in Al-Si alloys",

author = "Mihaela Albu and J. Li and P. Schumacher and Gerald Kothleitner and Ferdinand Hofer",

year = "2013",

month = sep,

day = "3",

language = "English",

note = "International Congress on Light Materials ; Conference date: 03-09-2013 Through 05-09-2013",

}

TY - CONF

T1 - Atomic resolution scanning transmission electron microscopy analysis of Sr and Yb addition in Al-Si alloys

AU - Albu, Mihaela

AU - Li, J.

AU - Schumacher, P.

AU - Kothleitner, Gerald

AU - Hofer, Ferdinand

PY - 2013/9/3

Y1 - 2013/9/3

M3 - (Old data) Lecture or Presentation

T2 - International Congress on Light Materials

Y2 - 3 September 2013 through 5 September 2013

ER -