Atomic resolution scanning transmission electron microscopy analysis of Sr and Yb addition in Al-Si alloys

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMagnesium; Aluminium; Titanum Science and Technology
Publisher.
Pages162-162
Publication statusPublished - 2013
EventInternational Congress on Light Materials - Bremen, Germany
Duration: 3 Sep 20135 Sep 2013

Conference

ConferenceInternational Congress on Light Materials
CountryGermany
CityBremen
Period3/09/135/09/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Albu, M., Li, J., Kothleitner, G., Schumacher, P., & Hofer, F. (2013). Atomic resolution scanning transmission electron microscopy analysis of Sr and Yb addition in Al-Si alloys. In Magnesium; Aluminium; Titanum Science and Technology (pp. 162-162). ..