Atomic force microscopy-scanning electrochemical microscopy: Influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes

Kelly Leonhardt, Amra Avdic, Alois Lugstein, Ilya Pobelov, Thomas Wandlowski, Ming Wu, Bernhard Gollas, Guy Denuault*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Atomic force microscopy-scanning electrochemical microscopy: Influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes'. Together they form a unique fingerprint.

Engineering