Atomic force microscopy-scanning electrochemical microscopy: Influence of tip geometry and insulation defects on diffusion controlled currents at conical electrodes

Kelly Leonhardt, Amra Avdic, Alois Lugstein, Ilya Pobelov, Thomas Wandlowski, Ming Wu, Bernhard Gollas, Guy Denuault*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Numerical simulations were performed to predict the amperometric response of conical electrodes used as atomic force microscopy-scanning electrochemical microscopy (AFM-SECM) probes. A simple general expression was derived which predicts their steady state limiting current as a function of their insulation sheath thickness and cone aspect ratio. Simulated currents were successfully compared with experimental currents. Geometrical parameters such as insulation angle and tip bluntness were then studied to determine their effect on the limiting current. Typical tip defects were also modeled using 3D simulations, and their influence on the current was quantified. Although obtained for SECM-AFM probes, these results are directly applicable to conical micro- and nanoelectrodes.

Original languageEnglish
Pages (from-to)2971-2977
Number of pages7
JournalAnalytical Chemistry
Volume83
Issue number8
DOIs
Publication statusPublished - 15 Apr 2011

ASJC Scopus subject areas

  • Analytical Chemistry

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