Atom Probe study of modifications on STM tips

Axel Stupnik, Alexander Fian, Manfred Leisch

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationIVC-16 ICCS-12 NANO-8 AIV-17 Book 2
Place of PublicationGenua
Publisher.
Pages143-143
Publication statusPublished - 2004
EventInternational Vacuum Congress - Venedig, Italy
Duration: 28 Jun 20042 Jul 2004

Conference

ConferenceInternational Vacuum Congress
CountryItaly
CityVenedig
Period28/06/042/07/04

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Stupnik, A., Fian, A., & Leisch, M. (2004). Atom Probe study of modifications on STM tips. In IVC-16 ICCS-12 NANO-8 AIV-17 Book 2 (pp. 143-143). Genua: ..

Atom Probe study of modifications on STM tips. / Stupnik, Axel; Fian, Alexander; Leisch, Manfred.

IVC-16 ICCS-12 NANO-8 AIV-17 Book 2. Genua : ., 2004. p. 143-143.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Stupnik, A, Fian, A & Leisch, M 2004, Atom Probe study of modifications on STM tips. in IVC-16 ICCS-12 NANO-8 AIV-17 Book 2. ., Genua, pp. 143-143, International Vacuum Congress, Venedig, Italy, 28/06/04.
Stupnik A, Fian A, Leisch M. Atom Probe study of modifications on STM tips. In IVC-16 ICCS-12 NANO-8 AIV-17 Book 2. Genua: . 2004. p. 143-143
Stupnik, Axel ; Fian, Alexander ; Leisch, Manfred. / Atom Probe study of modifications on STM tips. IVC-16 ICCS-12 NANO-8 AIV-17 Book 2. Genua : ., 2004. pp. 143-143
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