Atom probe analysis of passive films on iron

G. Bauer, Manfred Leisch

Research output: Contribution to journalArticlepeer-review

Abstract

Depth profiling analysis was performed for passive oxide films grown on pure iron specimens to determine the composition of the films and the interface regions. The thickness of the films as a function of applied potential and time of passivation was determined in order to get information on the kinetics of oxide growth. Benzotriazole commonly used as a corrosion inhibitor was added to the buffer solution to act as a tracer in the investigation of the mechanism of oxide growth.
Original languageEnglish
Pages (from-to)189-195
JournalJournal de physique / 3
Volume47
Issue numberC7
DOIs
Publication statusPublished - 1986

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

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