Assessment of the Stereo-Radargrammetric Mapping Potential of TerraSAR-X Multi-Beam Spotlight Data

Hannes Raggam; Karlheinz Gutjahr; Roland Perko; Mathias Schardt

doi:10.1109/TGRS.2009.2037315

Assessment of the Stereo-Radargrammetric Mapping Potential of TerraSAR-X Multi-Beam Spotlight Data

Hannes Raggam, Karlheinz Gutjahr, Roland Perko, Mathias Schardt

Working Group Remote Sensing and Photogrammetry (5222)

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	971-977
Journal	IEEE Geoscience and Remote Sensing Letters
Volume	48
Issue number	2
DOIs	https://doi.org/10.1109/TGRS.2009.2037315
Publication status	Published - 2010

Fields of Expertise

Sustainable Systems

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)
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Application
Theoretical

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10.1109/TGRS.2009.2037315

Publications of the Institute of Remote Sensing and Photogrammetry
Hollinger, G., Avian, M. & Prüller, R.
1/01/01 → …
Project: Research area

Cite this

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title = "Assessment of the Stereo-Radargrammetric Mapping Potential of TerraSAR-X Multi-Beam Spotlight Data",

author = "Hannes Raggam and Karlheinz Gutjahr and Roland Perko and Mathias Schardt",

note = "Special Issue on TerraSAR-X",

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journal = "IEEE Geoscience and Remote Sensing Letters",

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publisher = "Institute of Electrical and Electronics Engineers",

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T1 - Assessment of the Stereo-Radargrammetric Mapping Potential of TerraSAR-X Multi-Beam Spotlight Data

AU - Raggam, Hannes

AU - Gutjahr, Karlheinz

AU - Perko, Roland

AU - Schardt, Mathias

N1 - Special Issue on TerraSAR-X

PY - 2010

Y1 - 2010

U2 - 10.1109/TGRS.2009.2037315

DO - 10.1109/TGRS.2009.2037315

M3 - Article

SN - 1558-0571

VL - 48

SP - 971

EP - 977

JO - IEEE Geoscience and Remote Sensing Letters

JF - IEEE Geoscience and Remote Sensing Letters

IS - 2

ER -

Assessment of the Stereo-Radargrammetric Mapping Potential of TerraSAR-X Multi-Beam Spotlight Data

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Projects

Publications of the Institute of Remote Sensing and Photogrammetry

Cite this