Application of GTEM Cells for IC EMC Testing

R. Heinrich, V. Müllerwiebus, A. Lange, Bernd Deutschmann, U. Karsten, Frank Klotz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationAsia-Pacific Symposium on Electromagnetic Compatibility
Publisher.
Pages267-270
ISBN (Print)978-981-08-0629-3
DOIs
Publication statusPublished - 2008
EventAsia-Pacific Symposium on Electromagnetic Compatibility - Zürich, Switzerland
Duration: 19 May 200822 May 2008

Conference

ConferenceAsia-Pacific Symposium on Electromagnetic Compatibility
CountrySwitzerland
CityZürich
Period19/05/0822/05/08

Fields of Expertise

  • Sonstiges

Cite this

Heinrich, R., Müllerwiebus, V., Lange, A., Deutschmann, B., Karsten, U., & Klotz, F. (2008). Application of GTEM Cells for IC EMC Testing. In Asia-Pacific Symposium on Electromagnetic Compatibility (pp. 267-270). .. https://doi.org/10.1109/APEMC.2008.4559862