Application of GTEM Cells for IC EMC Testing

R. Heinrich; V. Müllerwiebus; A. Lange; Bernd Deutschmann; U. Karsten; Frank Klotz

doi:10.1109/APEMC.2008.4559862

Application of GTEM Cells for IC EMC Testing

R. Heinrich, V. Müllerwiebus, A. Lange, Bernd Deutschmann, U. Karsten, Frank Klotz

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Asia-Pacific Symposium on Electromagnetic Compatibility
Publisher	.
Pages	267-270
ISBN (Print)	978-981-08-0629-3
DOIs	https://doi.org/10.1109/APEMC.2008.4559862
Publication status	Published - 2008
Event	Asia-Pacific Symposium on Electromagnetic Compatibility - Zürich, Switzerland Duration: 19 May 2008 → 22 May 2008

Conference

Conference	Asia-Pacific Symposium on Electromagnetic Compatibility
Country/Territory	Switzerland
City	Zürich
Period	19/05/08 → 22/05/08

Fields of Expertise

Sonstiges

Access to Document

10.1109/APEMC.2008.4559862

Cite this

@inproceedings{67e0d27363b24c768d925fc4bf93e7ab,

title = "Application of GTEM Cells for IC EMC Testing",

author = "R. Heinrich and V. M{\"u}llerwiebus and A. Lange and Bernd Deutschmann and U. Karsten and Frank Klotz",

note = "2008 Asia-Pacific Symposium on EMC & 19th International Zurich Symposium on Electromagnetic Compatibility; Asia-Pacific Symposium on Electromagnetic Compatibility ; Conference date: 19-05-2008 Through 22-05-2008",

year = "2008",

doi = "10.1109/APEMC.2008.4559862",

language = "English",

isbn = "978-981-08-0629-3",

pages = "267--270",

booktitle = "Asia-Pacific Symposium on Electromagnetic Compatibility",

publisher = ".",

}

TY - GEN

T1 - Application of GTEM Cells for IC EMC Testing

AU - Heinrich, R.

AU - Müllerwiebus, V.

AU - Lange, A.

AU - Deutschmann, Bernd

AU - Karsten, U.

AU - Klotz, Frank

N1 - 2008 Asia-Pacific Symposium on EMC & 19th International Zurich Symposium on Electromagnetic Compatibility

PY - 2008

Y1 - 2008

U2 - 10.1109/APEMC.2008.4559862

DO - 10.1109/APEMC.2008.4559862

M3 - Conference paper

SN - 978-981-08-0629-3

SP - 267

EP - 270

BT - Asia-Pacific Symposium on Electromagnetic Compatibility

PB - .

T2 - Asia-Pacific Symposium on Electromagnetic Compatibility

Y2 - 19 May 2008 through 22 May 2008

ER -