Application of emission source microscopy technique to EMI source localization above 5 GHz

Pratik Maheshwari, Victor Khilkevich, David Pommerenke, Hamed Kajbaf, Jin Min

Research output: Contribution to journalConference articlepeer-review


This paper presents the utilization of the emission source microscopy (ESM) technique to localize active sources of radiation on a PCB. For complex and large systems with multiple sources, localizing the sources of radiation often proves difficult. Near-field scanning provides limited information about the components contributing to far-field radiation. Two-dimensional synthetic aperture radar, a well-known technique used to diagnose and align phase array antennas, is adapted as emission source microscopy and utilized here for this alternative application. This paper presents the source localization methodology, along with simulation and measurement results. The results show that the proposed method can detect multiple active sources on a complex PCB.

Original languageEnglish
Article number6898933
Pages (from-to)7-11
Number of pages5
JournalIEEE International Symposium on Electromagnetic Compatibility
Issue numberSeptember
Publication statusPublished - 15 Sep 2014
Externally publishedYes
Event2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, United States
Duration: 3 Aug 20148 Aug 2014


  • EMI
  • emission source microscopy
  • near-field scanning
  • SAR
  • source localization

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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