Application and limits of IC and PCB scanning methods for immunity analysis

David Pommerenke*, Giorgi Muchaidze, Jayong Koo, Qing Cai, Jin Min

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Immunity scanning methods can be used to locate sensitive areas on PCBs and ICs. For the analysis of emissions near field scanning is used to determine the local field strength. Both methods have many similarities and differences. For both methods it is difficult to correlate between board level scanning and system level test results as neither method shows the coupling path directly. The paper shows the implementation of an immunity scanning system and analyzes the advantages and limitations of immunity near field scanning.

Original languageEnglish
Title of host publicationProceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC
Pages83-86
Number of pages4
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
Event18th International Zurich Symposium on Electromagnetic Compatibility: EMC 2007 - Munich, Germany
Duration: 24 Sep 200728 Sep 2007

Publication series

NameProceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC

Conference

Conference18th International Zurich Symposium on Electromagnetic Compatibility
Country/TerritoryGermany
CityMunich
Period24/09/0728/09/07

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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