@inproceedings{be1b77ecda31411fa35267f67c1a55df,
title = "Application and limits of IC and PCB scanning methods for immunity analysis",
abstract = "Immunity scanning methods can be used to locate sensitive areas on PCBs and ICs. For the analysis of emissions near field scanning is used to determine the local field strength. Both methods have many similarities and differences. For both methods it is difficult to correlate between board level scanning and system level test results as neither method shows the coupling path directly. The paper shows the implementation of an immunity scanning system and analyzes the advantages and limitations of immunity near field scanning.",
author = "David Pommerenke and Giorgi Muchaidze and Jayong Koo and Qing Cai and Jin Min",
year = "2007",
month = dec,
day = "1",
doi = "10.1109/EMCZUR.2007.4388201",
language = "English",
isbn = "9783952328606",
series = "Proceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC",
pages = "83--86",
booktitle = "Proceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC",
note = "18th International Zurich Symposium on Electromagnetic Compatibility : EMC 2007 ; Conference date: 24-09-2007 Through 28-09-2007",
}