Analyzing the Nanogranularity of Focused-Electron-Beam-Induced-Deposited Materials by Electron Tomography

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Abstract

Nanogranular material systems are promisingfor a variety of applications in research and development.Their physical properties are often determined based on thegrain sizes, shapes, mutual distances, and chemistry of theembedding matrix. With focused-electron-beam-induceddeposition, arbitrarily shaped nanocomposite materials canbe designed, where metallic, nanogranular structures areembedded in a carbonaceous matrix. By using “post-growth”electron-beam curing, these materials can be tuned for animproved electric-transport or mechanical behavior. Such anoptimization necessitates a thorough understanding andcharacterization of the internal changes in chemistry andmorphology, which is where conventional two-dimensional imaging techniques fall short. We use scanning transmissionelectron tomography to obtain a comprehensive picture of the three-dimensional distribution and morphology of embedded Ptnanograins after initial fabrication and demonstrate the impact of electron-beam curing, which results in condensed regions ofinterconnected metal nanograins.
Original languageEnglish
Pages (from-to)5353-5359
JournalACS Applied Nano Materials
Volume2
Issue number9
DOIs
Publication statusPublished - 2019

ASJC Scopus subject areas

  • Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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