Analytical (S)TEM Investigations of Magnetic Semiconductors and Heusler Alloys

Arno Meingast, R. Koch, Alberta Bonanni, Gerald Kothleitner

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageEnglish
Publication statusPublished - 4 Sep 2011
EventMCM 2011 - Urbino, Italy
Duration: 4 Sep 20119 Sep 2011

Conference

ConferenceMCM 2011
CountryItaly
CityUrbino
Period4/09/119/09/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Meingast, A., Koch, R., Bonanni, A., & Kothleitner, G. (2011). Analytical (S)TEM Investigations of Magnetic Semiconductors and Heusler Alloys. MCM 2011, Urbino, Italy.