Analytical (S)TEM Investigations of Magnetic Semiconductors and Heusler Alloys

Arno Meingast, Alberta Bonanni, R. Koch, Gerald Kothleitner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
Pages545-546
Publication statusPublished - 2011
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Fields of Expertise

  • Mobility & Production

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Meingast, A., Bonanni, A., Koch, R., & Kothleitner, G. (2011). Analytical (S)TEM Investigations of Magnetic Semiconductors and Heusler Alloys. In Multinational Congress on Microscopy (pp. 545-546). ..