Analytical electron microscopy- an ultimate tool for exploring the enviromental living conditions 5300 years ago and nowadays

Maria Anna Pabst, Christoph Mitterbauer, Ilse Letofsky-Papst, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMicrobeam analysis 2000
EditorsDavid B. Williams, Ryuichi Shimizu
Place of PublicationBristol [u.a.]
PublisherIOP Publishing Ltd.
Pages189-190
Volume165
ISBN (Print)0-7503-0685-8
Publication statusPublished - 2000
EventConference of the International Union of Microbeam Analysis Societies - Kailua-Kona; Hawaii, United States
Duration: 9 Jul 200013 Jul 2000

Publication series

NameInstitute of Physics conference series
PublisherIOP Publishing Ltd

Conference

ConferenceConference of the International Union of Microbeam Analysis Societies
CountryUnited States
CityKailua-Kona; Hawaii
Period9/07/0013/07/00

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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