Abstract
Field levels in indirect Electrostatic Discharge (ESD) test setups are not known yet. It has been proposed to ANSI and IEC to use a horizontal simulator position instead of a vertical position in indirect ESD testing. This paper shows the field values on the Horizontal Coupling Plane for different topologies in comparison to human ESD and questions if the goal of the change - a reduction of the simulator influence - will be achieved. Also, investigations dealing with the sensitivity of digital devices to impulsive fields are presented.
| Original language | English |
|---|---|
| Pages (from-to) | 99-106 |
| Number of pages | 8 |
| Journal | Electrical Overstress Electrostatic Discharge Symposium Proceedings |
| Publication status | Published - 1 Dec 1997 |
| Externally published | Yes |
| Event | 19th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 1997 - Santa Clara, United States Duration: 23 Sept 1997 → 25 Sept 1997 |
ASJC Scopus subject areas
- Condensed Matter Physics