Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement

Stefan Mitsche, Peter Pölt, Julian Wagner

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)282-288
JournalScanning
Volume28
Publication statusPublished - 2006

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement. / Mitsche, Stefan; Pölt, Peter; Wagner, Julian.

In: Scanning, Vol. 28, 2006, p. 282-288.

Research output: Contribution to journalArticleResearchpeer-review

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title = "Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement",
author = "Stefan Mitsche and Peter P{\"o}lt and Julian Wagner",
year = "2006",
language = "English",
volume = "28",
pages = "282--288",
journal = "Scanning",
issn = "0161-0457",
publisher = "John Wiley and Sons Inc.",

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AU - Pölt, Peter

AU - Wagner, Julian

PY - 2006

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SP - 282

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JO - Scanning

JF - Scanning

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