Analysis of current sharing in large and small-signal IC pin models

Benjamin Orr; Pratik Maheshwari; David Pommerenke; Harald Gossner; Wolfgang Stadler

Analysis of current sharing in large and small-signal IC pin models

Benjamin Orr, Pratik Maheshwari, David Pommerenke, Harald Gossner, Wolfgang Stadler

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

A comprehensive model of a clock line including large and small signal pin parameters, as well as channel parameters is presented. The small signal model allows analysis of in-band interference which can lead to soft failures, while large signal models allow for the simulation of current sharing between driver/receiver pin pairs.

Original language	English
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume	2014-November
Edition	November
Publication status	Published - 26 Nov 2014
Externally published	Yes
Event	36th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2014 - Tucson, United States Duration: 7 Sept 2014 → 12 Sept 2014

Conference

Conference	36th Annual Electrical Overstress/Electrostatic Discharge Symposium
Abbreviated title	EOS/ESD 2014
Country/Territory	United States
City	Tucson
Period	7/09/14 → 12/09/14

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

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title = "Analysis of current sharing in large and small-signal IC pin models",

abstract = "A comprehensive model of a clock line including large and small signal pin parameters, as well as channel parameters is presented. The small signal model allows analysis of in-band interference which can lead to soft failures, while large signal models allow for the simulation of current sharing between driver/receiver pin pairs.",

author = "Benjamin Orr and Pratik Maheshwari and David Pommerenke and Harald Gossner and Wolfgang Stadler",

year = "2014",

month = nov,

day = "26",

language = "English",

isbn = "978-158537257-7",

volume = "2014-November",

booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

edition = "November",

note = "36th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2014, EOS/ESD 2014 ; Conference date: 07-09-2014 Through 12-09-2014",

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TY - GEN

T1 - Analysis of current sharing in large and small-signal IC pin models

AU - Orr, Benjamin

AU - Maheshwari, Pratik

AU - Pommerenke, David

AU - Gossner, Harald

AU - Stadler, Wolfgang

PY - 2014/11/26

Y1 - 2014/11/26

N2 - A comprehensive model of a clock line including large and small signal pin parameters, as well as channel parameters is presented. The small signal model allows analysis of in-band interference which can lead to soft failures, while large signal models allow for the simulation of current sharing between driver/receiver pin pairs.

AB - A comprehensive model of a clock line including large and small signal pin parameters, as well as channel parameters is presented. The small signal model allows analysis of in-band interference which can lead to soft failures, while large signal models allow for the simulation of current sharing between driver/receiver pin pairs.

UR - http://www.scopus.com/inward/record.url?scp=84938151176&partnerID=8YFLogxK

M3 - Conference paper

AN - SCOPUS:84938151176

SN - 978-158537257-7

VL - 2014-November

BT - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

T2 - 36th Annual Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 7 September 2014 through 12 September 2014

ER -

Analysis of current sharing in large and small-signal IC pin models

Abstract

Conference

ASJC Scopus subject areas

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