Analysis of CPU Loading Effect on ESD Susceptibility

Omid Hoseini Izadi, Hideki Shumiya, Shota Konno, Kenji Araki, David Johannes Pommerenke, DongHyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

Two complementary approaches are presented to help to understand how CPU loading affects the sensitivity of an electronic device to ESD (electrostatic discharge) stress. Both approaches rely on synchronized noise injection while the software is running at the desired load. One of the approaches monitors the device's current consumption while the other monitors the device's electromagnetic field to synchronize noise injections. These approaches revealed that as the CPU loading increases, the device becomes more active and hence more susceptible to ESD stress. Moreover, it was observed that, in each loading condition, the device randomly became susceptible. These complementary approaches enable the capturing of high/low active intervals as well as the injection of noise voltage to the desired activity, thus, allowing for the analysis of the effect of CPU loading on ESD susceptibility.
Original languageEnglish
Title of host publication2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020
Pages671-675
Number of pages5
ISBN (Electronic)978-1-7281-7430-3
DOIs
Publication statusPublished - Jul 2020
Event2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity: EMCSI 2020 - Virtual, Reno, United States
Duration: 27 Jul 202031 Jul 2020

Conference

Conference2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity
Abbreviated titleEMCSI 2020
Country/TerritoryUnited States
CityVirtual, Reno
Period27/07/2031/07/20

Keywords

  • CPU loading
  • electromagnetic interference (EMI)
  • Electrostatic discharge (ESD)
  • noise injection
  • soft failure

ASJC Scopus subject areas

  • Information Systems and Management
  • Safety, Risk, Reliability and Quality
  • Signal Processing
  • Radiation
  • Electrical and Electronic Engineering

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