Analysis and Modeling of Conducted EMI from an AC-DC Power Supply in LED TV up to 1 MHz

Chunyu Wu, Hongseok Kim*, Jiayi He, Nicholas Erickson, Sangho Cho, Dohyung Kim, Yeong Hur, David J. Pommerenke, Jun Fan

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Critical conduction mode (CRM) boost power factor correction (PFC) converter is widely used in ac-dc power supplies to achieve high power factor. The switching frequency varies in a half-line cycle. In this article, both the differential-mode (DM) and common-mode (CM) electromagnetic interference (EMI) noises below 1 MHz from the ac-dc power supply in a LED TV are analyzed and modeled. The power supply consists of two parts: CRM boost PFC converter and LLC resonant converter. The conducted EMI noise and noise source voltages are measured in the time domain and then converted to the frequency domain via short-time fast Fourier transform (STFFT). Through the joint time-frequency analysis using STFFT, the drain-to-source voltage of the power MOSFET in the PFC converter is identified as the dominant noise source of both CM and DM EMI noises below 1 MHz from the power supply. The EMI current path is different during different periods of a cycle of the line voltage. During most time of a cycle, two diodes of the bridge rectifier are forward biased, and the bridge rectifier can be treated as short circuit. The current paths of DM and CM EMI noises are explained and modeled by a linear equivalent circuit model. Three parasitic capacitances need to be considered to model the CM EMI noise in this device under test. From the circuit model, transfer functions relating DM and CM EMI spectra to noise source voltage spectrum are obtained. The conducted EMI spectra are predicted by multiplying the spectrum of noise source voltage by the transfer functions. The prediction matches with measurement. The effects of parasitic capacitances on CM EMI noise are analyzed by simulation and then validated by measurement. The analysis results can help with EMI design to reduce the CM EMI.

Original languageEnglish
Article number8922866
Pages (from-to)2050-2059
Number of pages10
JournalIEEE Transactions on Electromagnetic Compatibility
Volume61
Issue number6
DOIs
Publication statusPublished - 1 Dec 2019
Externally publishedYes

Keywords

  • Common mode (CM)
  • conducted emissions (CE)
  • critical conduction mode (CRM)
  • differential mode (DM)
  • electromagnetic interference (EMI)
  • power factor correction (PFC)
  • switched-mode power supply (SMPS)

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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