Analysis and metrological determination of the sensitivity distribution for a 16 electrode electrical capacitance tomography system

Anton Fuchs, Daniel Watzenig, Hubert Zangl, Gerald Steiner, Gert Holler

    Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

    Original languageEnglish
    Title of host publicationWorld Congress on Industrial Process Tomography
    Publisher.
    Pages141-148
    Publication statusPublished - 2007
    EventWorld Congress on Industrial Process Tomography - Bergen, Norway
    Duration: 3 Sept 20076 Sept 2007

    Conference

    ConferenceWorld Congress on Industrial Process Tomography
    Country/TerritoryNorway
    CityBergen
    Period3/09/076/09/07

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