Analysis and metrological determination of the sensitivity distribution for a 16 electrode electrical capacitance tomography system

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationWorld Congress on Industrial Process Tomography
Publisher.
Pages141-148
Publication statusPublished - 2007
EventWorld Congress on Industrial Process Tomography - Bergen, Norway
Duration: 3 Sep 20076 Sep 2007

Conference

ConferenceWorld Congress on Industrial Process Tomography
CountryNorway
CityBergen
Period3/09/076/09/07

Cite this

Analysis and metrological determination of the sensitivity distribution for a 16 electrode electrical capacitance tomography system. / Fuchs, Anton; Watzenig, Daniel; Zangl, Hubert; Steiner, Gerald; Holler, Gert.

World Congress on Industrial Process Tomography. ., 2007. p. 141-148.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fuchs, A, Watzenig, D, Zangl, H, Steiner, G & Holler, G 2007, Analysis and metrological determination of the sensitivity distribution for a 16 electrode electrical capacitance tomography system. in World Congress on Industrial Process Tomography. ., pp. 141-148, World Congress on Industrial Process Tomography, Bergen, Norway, 3/09/07.
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