An on-chip detector of transient stress events

A. Patnaik, M. Suchak, R. Seva, K. Pamidimukkala, D. Pommerenke, G. Edgington, R. Moseley, J. Feddeler, M. Stockinger, D. Beetner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Testing and debugging of electrostatic discharge (ESD) or electrical fast transient (EFT) issues in modern electronic systems can be challenging. The following paper describes the design of an on-chip circuit which detects and stores the occurrence of a fast transient stress event at the ESD protection structures in an I/O pad. Measurements and simulations of a test circuit in 90 nm technology show it can accurately detect and record the presence of a transient stress event with a peak current as low as 0.9 A or duration as short as 1 ns and that the detector works well across typical temperature and process variations. The small size of the detector will allow it to be used effectively even in low-cost commercial ICs.

Original languageEnglish
Title of host publication2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers
Pages146-151
Number of pages6
ISBN (Electronic)9781538622308
DOIs
Publication statusPublished - 20 Oct 2017
Externally publishedYes
Event2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Washington, United States
Duration: 7 Aug 201711 Aug 2017

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017
CountryUnited States
CityWashington
Period7/08/1711/08/17

Keywords

  • Electrical fast transient (EFT)
  • Electrostatic discharge (ESD)
  • ESD detectors
  • On-chip measurements
  • System level ESD

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Patnaik, A., Suchak, M., Seva, R., Pamidimukkala, K., Pommerenke, D., Edgington, G., ... Beetner, D. (2017). An on-chip detector of transient stress events. In 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMCSI 2017 - Proceedings (pp. 146-151). [8077857] (IEEE International Symposium on Electromagnetic Compatibility). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2017.8077857