An Investigatioin of Silicon Crystal Defects Caused by Boron Doping

Andreas Jörg Schriefl

Research output: ThesisBachelor's ThesisResearch

Original languageEnglish
Publication statusPublished - 2008

Fields of Expertise

  • Sonstiges

Treatment code (Nähere Zuordnung)

  • Application

Cite this

An Investigatioin of Silicon Crystal Defects Caused by Boron Doping. / Schriefl, Andreas Jörg.

2008.

Research output: ThesisBachelor's ThesisResearch

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author = "Schriefl, {Andreas J{\"o}rg}",
year = "2008",
language = "English",

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TY - THES

T1 - An Investigatioin of Silicon Crystal Defects Caused by Boron Doping

AU - Schriefl, Andreas Jörg

PY - 2008

Y1 - 2008

M3 - Bachelor's Thesis

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