An inductive probe for the measurement of common mode currents on differential traces

Victor Khilkevich*, David Pommerenke, Li Gang, Xu Shuai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Measuring common mode currents on differential microstrip transmission lines is a complicated task, because the common mode current, being the parasitic mode, is usually much weaker than the intended differential current. Hence, the measurement technique has to provide sufficient rejection of the differential mode. The probe described in this paper uses a shielded loop probe combined with a metallic screen to enhance the differential mode rejection of the current probe. The proposed techniques were tested on a test board at frequencies up to 6 GHz.

Original languageEnglish
Title of host publicationEMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
Pages720-724
Number of pages5
DOIs
Publication statusPublished - 12 Dec 2012
Externally publishedYes
Event2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012 - Pittsburgh, PA, United States
Duration: 5 Aug 201210 Aug 2012

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference2012 IEEE International Symposium on Electromagnetic Compatibility, EMC 2012
CountryUnited States
CityPittsburgh, PA
Period5/08/1210/08/12

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Khilkevich, V., Pommerenke, D., Gang, L., & Shuai, X. (2012). An inductive probe for the measurement of common mode currents on differential traces. In EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program (pp. 720-724). [6351645] (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2012.6351645