TY - GEN
T1 - An inductive probe for the measurement of common mode currents on differential traces
AU - Khilkevich, Victor
AU - Pommerenke, David
AU - Gang, Li
AU - Shuai, Xu
PY - 2012/12/12
Y1 - 2012/12/12
N2 - Measuring common mode currents on differential microstrip transmission lines is a complicated task, because the common mode current, being the parasitic mode, is usually much weaker than the intended differential current. Hence, the measurement technique has to provide sufficient rejection of the differential mode. The probe described in this paper uses a shielded loop probe combined with a metallic screen to enhance the differential mode rejection of the current probe. The proposed techniques were tested on a test board at frequencies up to 6 GHz.
AB - Measuring common mode currents on differential microstrip transmission lines is a complicated task, because the common mode current, being the parasitic mode, is usually much weaker than the intended differential current. Hence, the measurement technique has to provide sufficient rejection of the differential mode. The probe described in this paper uses a shielded loop probe combined with a metallic screen to enhance the differential mode rejection of the current probe. The proposed techniques were tested on a test board at frequencies up to 6 GHz.
UR - http://www.scopus.com/inward/record.url?scp=84870679888&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2012.6351645
DO - 10.1109/ISEMC.2012.6351645
M3 - Conference paper
AN - SCOPUS:84870679888
SN - 9781467320610
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 720
EP - 724
BT - EMC 2012 - 2012 IEEE International Symposium on Electromagnetic Compatibility, Final Program
T2 - 2012 IEEE International Symposium on Electromagnetic Compatibility
Y2 - 5 August 2012 through 10 August 2012
ER -