An Extended EDMR Setup for SiC Defect Characterization

Gernot Gruber, Markus Koch, Gregor Pobegen, Michael Nelhiebel, Peter Hadley

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Original language	German
Title of host publication	Silicon Carbide and Related Materials 2012
Publisher	Trans Tech Publications Ltd.
Pages	365-368
ISBN (Print)	978-3-03785-624-6
Publication status	Published - 2013
Event	European Conference on Silicon Carbide and Related Materials 2012 - St. Petersburg, Russian Federation Duration: 2 Sep 2012 → 6 Sep 2012

Conference	European Conference on Silicon Carbide and Related Materials 2012
Country	Russian Federation
City	St. Petersburg
Period	2/09/12 → 6/09/12

Gruber, G., Koch, M., Pobegen, G., Nelhiebel, M., & Hadley, P. (2013). An Extended EDMR Setup for SiC Defect Characterization. In Silicon Carbide and Related Materials 2012 (pp. 365-368). Trans Tech Publications Ltd..

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AU - Koch, Markus

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AU - Hadley, Peter

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