@inproceedings{d9744db7ca0d4f669214feefc91f3656,
title = "An Extended EDMR Setup for SiC Defect Characterization",
author = "Gernot Gruber and Markus Koch and Gregor Pobegen and Michael Nelhiebel and Peter Hadley",
year = "2013",
language = "deutsch",
isbn = "978-3-03785-624-6",
pages = "365--368",
booktitle = "Silicon Carbide and Related Materials 2012",
publisher = "Trans Tech Publications Ltd.",
note = "European Conference on Silicon Carbide and Related Materials 2012 ; Conference date: 02-09-2012 Through 06-09-2012",
}