An Extended EDMR Setup for SiC Defect Characterization

Gernot Gruber, Markus Koch, Gregor Pobegen, Michael Nelhiebel, Peter Hadley

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageGerman
Title of host publicationSilicon Carbide and Related Materials 2012
PublisherTrans Tech Publications Ltd.
Pages365-368
ISBN (Print)978-3-03785-624-6
Publication statusPublished - 2013
EventEuropean Conference on Silicon Carbide and Related Materials 2012 - St. Petersburg, Russian Federation
Duration: 2 Sep 20126 Sep 2012

Conference

ConferenceEuropean Conference on Silicon Carbide and Related Materials 2012
CountryRussian Federation
CitySt. Petersburg
Period2/09/126/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Gruber, G., Koch, M., Pobegen, G., Nelhiebel, M., & Hadley, P. (2013). An Extended EDMR Setup for SiC Defect Characterization. In Silicon Carbide and Related Materials 2012 (pp. 365-368). Trans Tech Publications Ltd..