An Extended EDMR Setup for SiC Defect Characterization

Gernot Gruber, Markus Koch, Gregor Pobegen, Michael Nelhiebel, Peter Hadley

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	German
Title of host publication	Silicon Carbide and Related Materials 2012
Publisher	Trans Tech Publications Ltd.
Pages	365-368
ISBN (Print)	978-3-03785-624-6
Publication status	Published - 2013
Event	European Conference on Silicon Carbide and Related Materials 2012 - St. Petersburg, Russian Federation Duration: 2 Sep 2012 → 6 Sep 2012

Conference	European Conference on Silicon Carbide and Related Materials 2012
Country/Territory	Russian Federation
City	St. Petersburg
Period	2/09/12 → 6/09/12

Fields of Expertise

@inproceedings{d9744db7ca0d4f669214feefc91f3656,

title = "An Extended EDMR Setup for SiC Defect Characterization",

author = "Gernot Gruber and Markus Koch and Gregor Pobegen and Michael Nelhiebel and Peter Hadley",

year = "2013",

language = "deutsch",

isbn = "978-3-03785-624-6",

pages = "365--368",

booktitle = "Silicon Carbide and Related Materials 2012",

publisher = "Trans Tech Publications Ltd.",

note = "null ; Conference date: 02-09-2012 Through 06-09-2012",

}

TY - GEN

T1 - An Extended EDMR Setup for SiC Defect Characterization

AU - Gruber, Gernot

AU - Koch, Markus

AU - Pobegen, Gregor

AU - Nelhiebel, Michael

AU - Hadley, Peter

PY - 2013

Y1 - 2013

UR - http://www.ttp.net/978-3-03785-624-6.html

M3 - Beitrag in einem Konferenzband

SN - 978-3-03785-624-6

SP - 365

EP - 368

BT - Silicon Carbide and Related Materials 2012

PB - Trans Tech Publications Ltd.

Y2 - 2 September 2012 through 6 September 2012

ER -