An Extended EDMR Setup for SiC Defect Characterization

Gernot Gruber, Markus Koch, Gregor Pobegen, Michael Nelhiebel, Peter Hadley

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageGerman
Title of host publicationSilicon Carbide and Related Materials 2012
PublisherTrans Tech Publications Ltd.
Pages365-368
ISBN (Print)978-3-03785-624-6
Publication statusPublished - 2013
EventEuropean Conference on Silicon Carbide and Related Materials 2012 - St. Petersburg, Russian Federation
Duration: 2 Sep 20126 Sep 2012

Conference

ConferenceEuropean Conference on Silicon Carbide and Related Materials 2012
CountryRussian Federation
CitySt. Petersburg
Period2/09/126/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Gruber, G., Koch, M., Pobegen, G., Nelhiebel, M., & Hadley, P. (2013). An Extended EDMR Setup for SiC Defect Characterization. In Silicon Carbide and Related Materials 2012 (pp. 365-368). Trans Tech Publications Ltd..

An Extended EDMR Setup for SiC Defect Characterization. / Gruber, Gernot; Koch, Markus; Pobegen, Gregor; Nelhiebel, Michael; Hadley, Peter.

Silicon Carbide and Related Materials 2012. Trans Tech Publications Ltd., 2013. p. 365-368.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Gruber, G, Koch, M, Pobegen, G, Nelhiebel, M & Hadley, P 2013, An Extended EDMR Setup for SiC Defect Characterization. in Silicon Carbide and Related Materials 2012. Trans Tech Publications Ltd., pp. 365-368, European Conference on Silicon Carbide and Related Materials 2012, St. Petersburg, Russian Federation, 2/09/12.
Gruber G, Koch M, Pobegen G, Nelhiebel M, Hadley P. An Extended EDMR Setup for SiC Defect Characterization. In Silicon Carbide and Related Materials 2012. Trans Tech Publications Ltd. 2013. p. 365-368
Gruber, Gernot ; Koch, Markus ; Pobegen, Gregor ; Nelhiebel, Michael ; Hadley, Peter. / An Extended EDMR Setup for SiC Defect Characterization. Silicon Carbide and Related Materials 2012. Trans Tech Publications Ltd., 2013. pp. 365-368
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