An experimental investigation of higher order mode suppression in TEM cells

Shaowei Deng*, David Pommerenke, Todd Hubing, Dongshik Shin

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Transverse electromagnetic (TEM) cells can be used to evaluate the electric and magnetic fields coupling from integrated circuits (ICs). The propagation and reflection of higher order modes in the cells limits the bandwidth of TEM cells. This paper investigates several methods for suppressing higher order modes in TEM cells in order to extend the applicable frequency range without changing the test topology. Numerical models and measurements of a modified TEM cell demonstrate how higher order mode suppression techniques can extend the useful frequency range of a TEM cell for IC measurements from 1 to 2.5 GHz.

Original languageEnglish
Pages (from-to)416-419
Number of pages4
JournalIEEE Transactions on Electromagnetic Compatibility
Volume50
Issue number2
DOIs
Publication statusPublished - 1 May 2008
Externally publishedYes

Keywords

  • Higher order mode
  • Resonant frequency
  • Slotted septum
  • Transverse electromagnetic (TEM) cell

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'An experimental investigation of higher order mode suppression in TEM cells'. Together they form a unique fingerprint.

Cite this