An ellipsometric approach to data of liquid alloys: Part A - investigation of normal spectral emittance at 684.5 nm

Boris Wilthan, Claus Cagran, Gernot Pottlacher

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Conference on Spectroscopic Ellipsometry
Publisher.
Pages147-147
Publication statusPublished - 2007
EventInternational Conference on Spectroscopic Ellipsometry - Stockholm, Sweden
Duration: 11 Jun 200715 Jun 2007

Conference

ConferenceInternational Conference on Spectroscopic Ellipsometry
CountrySweden
CityStockholm
Period11/06/0715/06/07

Cite this

Wilthan, B., Cagran, C., & Pottlacher, G. (2007). An ellipsometric approach to data of liquid alloys: Part A - investigation of normal spectral emittance at 684.5 nm. In International Conference on Spectroscopic Ellipsometry (pp. 147-147). ..

An ellipsometric approach to data of liquid alloys: Part A - investigation of normal spectral emittance at 684.5 nm. / Wilthan, Boris; Cagran, Claus; Pottlacher, Gernot.

International Conference on Spectroscopic Ellipsometry. ., 2007. p. 147-147.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Wilthan, B, Cagran, C & Pottlacher, G 2007, An ellipsometric approach to data of liquid alloys: Part A - investigation of normal spectral emittance at 684.5 nm. in International Conference on Spectroscopic Ellipsometry. ., pp. 147-147, International Conference on Spectroscopic Ellipsometry, Stockholm, Sweden, 11/06/07.
Wilthan B, Cagran C, Pottlacher G. An ellipsometric approach to data of liquid alloys: Part A - investigation of normal spectral emittance at 684.5 nm. In International Conference on Spectroscopic Ellipsometry. . 2007. p. 147-147
Wilthan, Boris ; Cagran, Claus ; Pottlacher, Gernot. / An ellipsometric approach to data of liquid alloys: Part A - investigation of normal spectral emittance at 684.5 nm. International Conference on Spectroscopic Ellipsometry. ., 2007. pp. 147-147
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