An effective method of probe calibration in phase-resolved near-field scanning for EMI application

Ji Zhang*, Keong W. Kam, Jin Min, Victor V. Khilkevich, David Pommerenke, Jun Fan

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Near-field scanning can be used to determine the far-field emissions of electronic devices. In general, this requires phase-resolved electric and magnetic near-field data. To capture a broad frequency range relatively quickly, a multichannel oscilloscope can be used for data capture. The phase relationship of the fields between different space points and between the electric and the magnetic field needs to be known. Consequently, it is required to determine the complex-valued probe factor (PF) of the probe, cable, and amplifier chain. This paper presents a fast and efficient calibration method which uses the same setup and instruments during calibration and measurement, and it allows for easy and economical integration of the calibration hardware and software into the scanning system. Known fields are created by a microstrip trace driven with a comb generator. By referencing measured data to this known field, the PF is obtained over a broad frequency range by capturing one time-domain waveform.

Original languageEnglish
Article number6338299
Pages (from-to)648-658
Number of pages11
JournalIEEE Transactions on Instrumentation and Measurement
Volume62
Issue number3
DOIs
Publication statusPublished - 1 Jan 2013
Externally publishedYes

Keywords

  • Electromagnetic interference (EMI)
  • near-field scanning
  • phase resolved
  • probe calibration
  • time-domain measurement

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

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