An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software

Christian Bachmann, Andreas Genser, Christian Steger, Reinhold Weiß, Josef Haid

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationPower and Timing Modeling, Optimization and Simulation, 20th International Workshop, PATMOS 2010
Publisher.
Pages11-20
Publication statusPublished - 2010

Cite this

Bachmann, C., Genser, A., Steger, C., Weiß, R., & Haid, J. (2010). An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software. In Power and Timing Modeling, Optimization and Simulation, 20th International Workshop, PATMOS 2010 (pp. 11-20). ..

An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software. / Bachmann, Christian; Genser, Andreas; Steger, Christian; Weiß, Reinhold; Haid, Josef.

Power and Timing Modeling, Optimization and Simulation, 20th International Workshop, PATMOS 2010. ., 2010. p. 11-20.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bachmann, C, Genser, A, Steger, C, Weiß, R & Haid, J 2010, An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software. in Power and Timing Modeling, Optimization and Simulation, 20th International Workshop, PATMOS 2010. ., pp. 11-20.
Bachmann C, Genser A, Steger C, Weiß R, Haid J. An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software. In Power and Timing Modeling, Optimization and Simulation, 20th International Workshop, PATMOS 2010. . 2010. p. 11-20
Bachmann, Christian ; Genser, Andreas ; Steger, Christian ; Weiß, Reinhold ; Haid, Josef. / An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software. Power and Timing Modeling, Optimization and Simulation, 20th International Workshop, PATMOS 2010. ., 2010. pp. 11-20
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