An approach to characterize behavior of multiport ICs under ESD stress

Omid Hoseini Izadi, Kathleen Muhonen, Nathaniel Peachey, David Pommerenke

Research output: Chapter in Book/Report/Conference proceedingConference paper

Fingerprint

Dive into the research topics of 'An approach to characterize behavior of multiport ICs under ESD stress'. Together they form a unique fingerprint.

Engineering & Materials Science